The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Sep. 03, 2004
Koichi Yatsuka, Tokyo, JP;
Koichi Yatsuka, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided a test apparatus that tests an electronic device. The test apparatus includes: a plurality of test modules operable to supply and receive signals to/from the electronic device; a plurality of return circuits operable to receive fail timing signals indicating timing at which a fail occurs on output patterns output from the electronic device, the return circuits being provided corresponding to the plurality of test modules; a plurality of summarizing units operable to receive the fail timing signals output from the plurality of return circuits and compute logical sum of one or more fail timing signals among the plurality of fail timing signals to output one bit signal; and a plurality of distributing units operable to distribute the computed results of corresponding ones of the summarizing units to the plurality of test modules, the distributing units being provided corresponding to the plurality of summarizing units.