The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Sep. 23, 2005
Pao-nan LI, Kaoshiung, TW;
Chih-wei Tsai, Kaoshiung, TW;
Pao-Nan Li, Kaoshiung, TW;
Chih-Wei Tsai, Kaoshiung, TW;
Advanced Semiconductor Engineering, Inc., Kaoshiung, TW;
Abstract
An electrical test device including a substrate and a plurality of test pads. The test pads are disposed on a second surface of the substrate. Each test pad has a test hole, and first and second isolation slots. The first isolation slot is disposed on the periphery of the test hole, and defines a signal region for connecting a signal terminal of a test probe. The second isolation slot is disposed on the periphery of the first isolation slot, and a ground region is defined between the first and second isolation slots. The ground region is used for connecting a ground terminal of the test probe. The test pad can match with the test probe so that the test probe can connect to the test pad for providing signal to the test probe. The electrical test device can easily measure the real electrical characteristic of the signal from the substrate.