The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2007

Filed:

Jun. 24, 2003
Applicants:

Shuichi Takayama, Ann Arbor, MI (US);

Xiaoyue Zhu, Ann Arbor, MI (US);

Joong Hwan Bahng, Ann Arbor, MI (US);

Elizabeth Ho Liu, Ann Arbor, MI (US);

Jeongsup Shim, Ann Arbor, MI (US);

Inventors:

Shuichi Takayama, Ann Arbor, MI (US);

Xiaoyue Zhu, Ann Arbor, MI (US);

Joong Hwan Bahng, Ann Arbor, MI (US);

Elizabeth Ho Liu, Ann Arbor, MI (US);

Jeongsup Shim, Ann Arbor, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12N 5/00 (2006.01); C12N 11/00 (2006.01); C12Q 1/00 (2006.01); C12Q 1/02 (2006.01); C07K 17/08 (2006.01); C07K 17/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Nanopatterned devices are easily fabricated, over large surface areas when desired, by forming a multilayer article of deformable substrate, brittle layer, and coating layer, and deforming the multilayer film such that a plurality of cracks are formed therein. The cracks have different physicochemical properties than the non-cracked coating layer, and advantageously serve as attachment points for culturing microorganisms.


Find Patent Forward Citations

Loading…