The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2007
Filed:
Jun. 19, 2002
Lee Song, Simi Valley, CA (US);
Lee Song, Simi Valley, CA (US);
Teradyne, Inc., North Reading, MA (US);
Abstract
An analog/mixed-signal DFT/BIST test module for use in a semiconductor tester to support DFT/BIST testing of semiconductor devices having at least one analog/mixed-signal circuit-under-test is disclosed. The analog/mixed-signal circuit-under-test coupled to an on-chip test circuit having a test signal input and a test signal output. The analog/mixed-signal DFT/BIST test module includes signal source circuitry for generating test signals for application to the test signal input of the analog/mixed-signal circuit-under-test and capture circuitry for acquiring output signals from the test signal output of the analog/mixed-signal circuit-under-test. Processing circuitry responsive to user-programmed algorithms analyzes the output signals from the analog/mixed-signal circuit under test independent of the semiconductor tester host computer.