The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2007
Filed:
Jul. 30, 2004
J. Alex Chediak, Eagan, MN (US);
Zhongsheng Luo, Albany, CA (US);
Timothy D. Sands, West Lafayette, IN (US);
Nathan W. Cheung, Albany, CA (US);
Luke P. Lee, Orinda, CA (US);
Jeonggi Seo, Albany, CA (US);
J. Alex Chediak, Eagan, MN (US);
Zhongsheng Luo, Albany, CA (US);
Timothy D. Sands, West Lafayette, IN (US);
Nathan W. Cheung, Albany, CA (US);
Luke P. Lee, Orinda, CA (US);
Jeonggi Seo, Albany, CA (US);
The Regents of the Unversity of California, Oakland, CA (US);
Abstract
The present invention relates to a functionally integrated microanalytical system for performing fluorescence spectroscopy. A source of fluorescence-exciting radiation, typically a LED, is integrated onto a substrate along with a photodetector and, in some embodiments, an optical filter. A pixel-to-point laser lift-off process is used to effect this component integration. For those cases in which a filter is required, a thin film bandgap filter is typically used, such as CdS or CdSSe(0<x<1). A disposable microchannel containing the sample and its fluorescent tag is mounted onto the integrated assembly of LED, photodetector and (optionally) filter. This configuration of components allows the microchannel and sample to be readily removed and replaced, facilitating rapid analysis of multiple samples. Multiple LEDS, detectors and filters (if present) can also be integrated onto the same substrate, permitting multiple wavelength analysis of the sample to be performed concurrently.