The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Oct. 04, 2000
Yoshitada Oshida, Chigasaki, JP;
Toshihiko Nakata, Hiratsuka, JP;
Tomoaki Sakata, Hiratsuka, JP;
Kenji Yasuda, Tokyo, JP;
Satoshi Takahashi, Hitachinaka, JP;
Yoshitada Oshida, Chigasaki, JP;
Toshihiko Nakata, Hiratsuka, JP;
Tomoaki Sakata, Hiratsuka, JP;
Kenji Yasuda, Tokyo, JP;
Satoshi Takahashi, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A method of inspecting a DNA chip and an apparatus therefor that allow a picture to be reconstructed in the following steps: A plurality of irradiation spots are formed on a DNA probe array mounted on a stage. Then, the stage is displaced in X, Y directions so as to execute a scanning, thereby irradiating substantially all the entire surface of the DNA probe array. Next, a plurality of emitted fluorescent lights, which are generated from the plurality of irradiation spot portions on the DNA probe array, are converged and are then detected simultaneously by multi detectors. Finally, a data processing apparatus processes the detected signals, thereby reconstructing the picture.