The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Jun. 26, 2003
Brian C. Phelps, Simi Valley, CA (US);
Jonathan M. Hops, Thousand Oaks, CA (US);
Jacob S. Scherb, Canoga Park, CA (US);
Brian C. Phelps, Simi Valley, CA (US);
Jonathan M. Hops, Thousand Oaks, CA (US);
Jacob S. Scherb, Canoga Park, CA (US);
Teradyne, Inc., Boston, MA (US);
Abstract
A method for testing semiconductor devices that output non-deterministic entity information such as packet and control signals is disclosed. The method includes the steps generating test signals with a semiconductor tester and applying the generated test signals to the device-under-test. Actual output entities from the DUT in response to the applied generated test signals are captured by the tester and compared to expected output entities. If a failure is identified in the comparing step, the method defines a window of valid expected entities and compares the failed actual output entity to the window of valid expected entities. If a match occurs between the failed actual output entity and any of the expected entities in the window, the actual entity is deemed valid.