The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2007

Filed:

Aug. 24, 2005
Applicants:

Chao Yuan, Plainsboro, NJ (US);

Claus Neubauer, Monmouth Junction, NJ (US);

Zehra Cataltepe, Red Bank, NJ (US);

Inventors:

Chao Yuan, Plainsboro, NJ (US);

Claus Neubauer, Monmouth Junction, NJ (US);

Zehra Cataltepe, Red Bank, NJ (US);

Assignee:

Siemens Corporate Research, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for detecting faults in a system monitored by a plurality of sensors is provided. The apparatus includes a hidden process driver unit that generates a hidden process driver based upon sensor values received from a group of correlated sensors selected from among the plurality of sensors. The apparatus also includes a sensor estimating unit that generates sensor estimates for each of the plurality of sensors based upon the hidden process driver and a known process driver provided by an uncorrelated sensor. The apparatus further includes a fault determining unit that indicates a fault when a residual based upon a difference between a sensor value supplied by one of the plurality of sensors and a corresponding one of the sensor estimates lies outside an acceptable range of residual values.


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