The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Dec. 30, 2004
Tzu-yu Wang, Maple Grove, MN (US);
Cleopatra Cabuz, Edina, MN (US);
Eugen I Cabuz, Edina, MN (US);
Stephen R. Shiffer, Pearl City, IL (US);
David J. Zook, Golden Valley, MN (US);
Tzu-Yu Wang, Maple Grove, MN (US);
Cleopatra Cabuz, Edina, MN (US);
Eugen I Cabuz, Edina, MN (US);
Stephen R. Shiffer, Pearl City, IL (US);
David J. Zook, Golden Valley, MN (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
A control system coupled to a pressure sensor calibrates the pressure sensor. The control system may measure a plurality of capacitance values at a plurality of corresponding applied voltages to compare the values with a first calibration mechanism generated by sample pressure sensors in a comparison. A final calibration mechanism may be generated by adjusting the first calibration mechanism in response to the comparison. The unknown differential pressure may be applied to a diaphragm of the pressure sensor. A capacitance value at the unknown differential pressure may then be measured. Using the final calibration mechanism, the differential pressure at the measured capacitance value may be retrieved.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile