The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Jul. 26, 2005
Mineo Nomoto, Yokohama, JP;
Daiske Katsuta, Yokohama, JP;
Toshio Asano, Hiroshima, JP;
Kaoru Sakai, Yokohama, JP;
Tetsuo Taguchi, Hitachi, JP;
Isao Tanaka, Tokai, JP;
Mineo Nomoto, Yokohama, JP;
Daiske Katsuta, Yokohama, JP;
Toshio Asano, Hiroshima, JP;
Kaoru Sakai, Yokohama, JP;
Tetsuo Taguchi, Hitachi, JP;
Isao Tanaka, Tokai, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention relates to a method for inspecting a crack in a metal surface or the like, and, particularly, to an inspection method and apparatus for nondestructive inspection such as liquid penetrant inspection and magnetic particle testing. The present invention provides a flaw inspection method that essentially comprises the steps of illuminating a surface of a sample to be inspected, obtaining an image of the surface, characterizing a potential flaw on the inspected surface by processing the obtained image, displaying an image of the potential flaw, verifying that the potential flaw is a true flaw, and storing an image of the verified flaw in memory.