The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2007

Filed:

Nov. 19, 2004
Applicants:

Russell W. Gruhlke, Fort Collins, CO (US);

Dale W. Schroeder, Scotts Valley, CA (US);

John H. Stanback, Fort Collins, CO (US);

Inventors:

Russell W. Gruhlke, Fort Collins, CO (US);

Dale W. Schroeder, Scotts Valley, CA (US);

John H. Stanback, Fort Collins, CO (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Imaging systems and methods are provided. One exemplary system incorporates multiple lenses that are individually configured to receive multi-wavelength light from an object to be imaged. Each lens provides an optimal modulation transfer function (MTF) for an individual wavelength contained in the multi-wavelength light when this individual wavelength of light strikes the lens at a particular incident angle. Associated with each lens is a color filter and a sensor. The color filter receives the multi-wavelength light from the lens, and transmits the individual wavelength of light on to the sensor. The image signals obtained from each of the multiple sensors are combined to generate an image of the object.


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