The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2007

Filed:

Jan. 27, 2005
Applicants:

Charles Patrick Collier, San Marino, CA (US);

MA Ziyang, Pasandena, CA (US);

Stephen R. Quake, San Marino, CA (US);

Ian R. Shapiro, Pasadena, CA (US);

Lawrence Wade, LaCanada, CA (US);

Inventors:

Charles Patrick Collier, San Marino, CA (US);

Ma Ziyang, Pasandena, CA (US);

Stephen R. Quake, San Marino, CA (US);

Ian R. Shapiro, Pasadena, CA (US);

Lawrence Wade, LaCanada, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01); G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for fabricating assembled structures. The method includes providing a tip structure, which has a first end, a second end, and a length defined between the first end and the second end. The second end is a free end. The method includes attaching a nano-sized structure along a portion of the length of the tip structure to extend a total length of the tip structure to include the length of the tip structure and a first length associated with the nano-sized structure. The method includes shortening the nano-sized structure from the first length to a second length. The method also includes pushing the nano-sized structure in a direction parallel to the second length to reduce the second length to a third length of the nano-sized structure along the direction parallel to the second length to cause the nano-sized structure to move along a portion of the length of the tip structure.


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