The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2007

Filed:

Aug. 13, 2004
Applicants:

Conrad Mukai, San Jose, CA (US);

Ankan Pramanick, San Jose, CA (US);

Mark Elston, Salinas, CA (US);

Toshiaki Adachi, San Jose, CA (US);

Leon L. Chen, San Jose, CA (US);

Inventors:

Conrad Mukai, San Jose, CA (US);

Ankan Pramanick, San Jose, CA (US);

Mark Elston, Salinas, CA (US);

Toshiaki Adachi, San Jose, CA (US);

Leon L. Chen, San Jose, CA (US);

Assignee:

Advantest America R&D Center, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for simulating a modular test system is disclosed. The method includes providing a controller, where the controller controls at least one vendor module and its corresponding device under test (DUT) model, creating a simulation framework for establishing standard interfaces between the at least one vendor module and its corresponding DUT model, configuring the simulation framework, and simulating the modular test system using the simulation framework.


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