The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Aug. 13, 2004
Harsanjeet Singh, Danville, CA (US);
Ankan Pramanick, San Jose, CA (US);
Mark Elston, Salinas, CA (US);
Yoshifumi Tahara, Sunnyvale, CA (US);
Toshiaki Adachi, San Jose, CA (US);
Harsanjeet Singh, Danville, CA (US);
Ankan Pramanick, San Jose, CA (US);
Mark Elston, Salinas, CA (US);
Yoshifumi Tahara, Sunnyvale, CA (US);
Toshiaki Adachi, San Jose, CA (US);
Advantest America R&D Center, Inc., Santa Clara, CA (US);
Abstract
A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least one test module and its corresponding device under test (DUT). The method further includes creating an object file management framework for establishing a standard interface between vendor-supplied pattern compilers and the modular test system, receiving a pattern source file, creating a pattern object metafile based on the pattern source file using the object file management framework, and testing the device under test through the test module using the pattern object metafile.