The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Oct. 14, 2004
Takeyoshi Taguchi, Tachikawa, JP;
Takeyoshi Taguchi, Tachikawa, JP;
Rigaku Corporation, Akishima-Shi, Tokyo, JP;
Abstract
An X-ray analysis apparatus in which X-rays emitted from an X-ray source are applied to a sample and a two-dimensional CCD sensor detects the X-rays diffracted by the sample. The X-ray analysis apparatus includes a scan-moving means for scan-moving the two-dimensional CCD sensor in a plane, and a charge-transfer signal generating means for generating a charge-transfer signal in the CCD sensor, every time the CCD sensor is moved for a distance corresponding to the width of a pixel constituting the CCD sensor. Hence, the motion of the semiconductor X-ray detecting means and the generation of the charge-transfer signal are synchronized with each other to achieve time delay integration operation. Since the timing of transfer of electric charges in the CCD sensor is synchronized with scan-motion velocity of the CCD sensor, each pixel can accurately analyze the intensity of the X-ray diffracted at each diffraction angle.