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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7206703 B1

PDFFull Text
Date of Patent:
Apr. 17, 2007

Filed:

May. 02, 2005

System and method for testing packaged devices using time domain reflectometry

Applicants:

Vassilios Papageorgiou, Austin, TX (US);

Michael Zhuoying Su, Round Rock, TX (US);

Amado Ramirez, Austin, TX (US);

Gary A. Cousins, Austin, TX (US);

Inventors:

Vassilios Papageorgiou, Austin, TX (US);

Michael Zhuoying Su, Round Rock, TX (US);

Amado Ramirez, Austin, TX (US);

Gary A. Cousins, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:

Meyertons Hood Kivlin Kowert & Goetzel, P.C.

Rory D. Rankin

Primary Examiner:

Michael Nghiem

Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test system configured to detect discontinuities in packaged devices. A test unit includes a pulse generator and a sampling circuit. The packaged device is coupled to the test unit via a test fixture. The test unit is configured to transmit a pulse to the packaged device through the test fixture, receive a reflected signal from the packaged device through the test fixture in response to the transmitted pulse, and analyze the reflected signal to detect a discontinuity within the packaged device and/or determine the location of a discontinuity within the packaged device. The test system is configured to store a calibration dataset which includes a set of sample values corresponding to a time domain reflectometry (TDR) test of a calibration packaged device. The test unit is configured to compare data corresponding to the reflected signal to stored values of the calibration dataset to detect a discontinuity in the packaged device.

Find Patent Forward Citations

Papageorgiou, Vassilios. (2007). System and method for testing packaged devices using time domain reflectometry (U.S. Patent No. 7206703). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7206703

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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