The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2007
Filed:
Aug. 07, 2000
Sharon Duvdevani, Mazkeret Batya, IL;
Tally Gilat-bernshtein, Yavne, IL;
Eyal Klingbell, Rehovot, IL;
Meir Mayo, Rehovot, IL;
Shmuel Rippa, Ramat Gan, IL;
Zeev Smilansky, Meishar, IL;
Sharon Duvdevani, Mazkeret Batya, IL;
Tally Gilat-Bernshtein, Yavne, IL;
Eyal Klingbell, Rehovot, IL;
Meir Mayo, Rehovot, IL;
Shmuel Rippa, Ramat Gan, IL;
Zeev Smilansky, Meishar, IL;
Orbotech Ltd., , IL;
Abstract
A method for inspecting objects comprising: creating a reference image for a representative object, the reference image comprising an at least partially vectorized first representation of boundaries representing the representative object; acquiring an image of an object under inspection comprising a second representation of boundaries representing the object under inspection; and comparing a location of at least some boundaries in the second representation of boundaries to a location of corresponding boundaries in the at least partially vectorized first representation of boundaries, thereby to identify defects.