The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2007
Filed:
Jan. 06, 2003
Applicant:
Ara V. Nefian, Sunnyvale, CA (US);
Inventor:
Ara V. Nefian, Sunnyvale, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G10L 15/00 (2006.01); G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A pattern recognition procedure forms a hierarchical statistical model using a hidden Markov model and a coupled hidden Markov model. The hierarchical statistical model supports a pa 20 layer having multiple supernodes and a child layer having multiple nodes associated with each supernode of the parent layer. After training, the hierarchical statistical model uses observation vectors extracted from a data set to find a substantially optimal state sequence segmentation.
Nefian, Ara. (2007). Embedded bayesian network for pattern recognition (U.S. Patent No. 7203368). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7203368
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile