The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Jul. 23, 2000
Uri Gold, Holon, IL;
Eli Parente, Rishon le Zion, IL;
Tally Gilat-bernshtein, Yavne, IL;
Edward Baranovsky, Rehovot, IL;
Tamir Margalit, Mazor, IL;
Uri Gold, Holon, IL;
Eli Parente, Rishon le Zion, IL;
Tally Gilat-Bernshtein, Yavne, IL;
Edward Baranovsky, Rehovot, IL;
Tamir Margalit, Mazor, IL;
Orbotech Ltd., Yavne, IL;
Abstract
This invention discloses a method for determining a location of a border in a color image, the image comprising at least two color populations, between a first color region associated with a first one of the two color populations and a second color region associated with a second one of the two color populations, both the first color region and the second color region being comprised in the color image, the method includes identifying an approximate border location between the first color region and the second color region, determining a plurality of candidate border locations between the first color region and the second color region, each of the plurality of candidate border locations being determined by applying a corresponding border location method chosen from among a plurality of border location methods, choosing one method from among the plurality of border location methods as a preferred method, and determining a location of a border between the first color region and the second color region by designating one of the plurality of candidate border locations associated with the preferred method as the border. An automated optical inspection device suitable for inspection of patterned articles is also disclosed.