The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7199596 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 03, 2007

Filed:

Dec. 06, 2005
Applicant:

Masanori Nagashima, Tokyo, JP;

Inventor:

Masanori Nagashima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01); G01R 31/02 (2006.01); H01R 33/76 (2006.01);
U.S. Cl.
CPC ...
Abstract

A manual testing instrumentis configured by an IC device holding membermounted on a socket guidein a removable way and capable of regulating a position of an IC devicein the planar direction with respect to connection terminals of a socket; and a height regulating device, a position of which is variable in the height direction, having a contact memberfor contacting an upper surface of the IC deviceand regulating a position of the IC devicein the height direction. A position of the contact memberin the height direction can be changed by combination of a blockformed with a plurality of grooveshaving different depths and a regulating memberformed with an arm portionto fit in a grooveon the block


Find Patent Forward Citations

Nagashima, Masanori. (2007). Manual testing instrument (U.S. Patent No. 7199596). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7199596

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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