The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Sep. 12, 2001
Naoki Mukoyama, Kawasaki, JP;
Kenichiro Yamada, Kawasaki, JP;
Hitoshi Kanai, Kawasaki, JP;
Manabu Watanabe, Kawasaki, JP;
Norikazu Ozaki, Kawasaki, JP;
Kazuaki Satoh, Kawasaki, JP;
Naoki Mukoyama, Kawasaki, JP;
Kenichiro Yamada, Kawasaki, JP;
Hitoshi Kanai, Kawasaki, JP;
Manabu Watanabe, Kawasaki, JP;
Norikazu Ozaki, Kawasaki, JP;
Kazuaki Satoh, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
The magnetoresistance is measured for a magnetoresistive layered-structure, such as a spin valve film, prior to formation of an upper shield layer as well as patterning of a lower shield layer. The magnetic influence of the upper and lower shield layers can completely be eliminated during the measurement of the magnetoresistance. The magnetoresistive layered-structure is allowed to reliably receive the magnetic field over a wider range including a lower magnetic field range. It is accordingly possible to measure the magnetoresistance properly reflecting the magnetic characteristic of the magnetoresistive layered-structure. It is possible to find deficiency of a magnetoresistive read element at an earlier stage of the method.