The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7197670 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 27, 2007

Filed:

Dec. 31, 2003
Applicants:

Bryan D. Boatright, Austin, TX (US);

Ben J. Eapen, Portland, OR (US);

C. Glenn Shirley, Portland, OR (US);

Carl Scafidi, Fort Collins, CO (US);

Inventors:

Bryan D. Boatright, Austin, TX (US);

Ben J. Eapen, Portland, OR (US);

C. Glenn Shirley, Portland, OR (US);

Carl Scafidi, Fort Collins, CO (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In accordance with various embodiments of the present invention, a cache-equipped semi-conductor device is provided with enhanced error detection logic to detect a first location-independent error within an area of the cache memory and prevent further use of the area if the error is determined to be the second consecutive error associated with a common area.


Find Patent Forward Citations

Boatright, Bryan. (2007). Methods and apparatuses for reducing infant mortality in semiconductor devices utilizing static random access memory (sram) (U.S. Patent No. 7197670). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7197670

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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