The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2007
Filed:
Aug. 13, 2004
Ankan Pramanick, San Jose, CA (US);
Mark Elston, Salinas, CA (US);
Ramachandran Krishnaswamy, Cupertino, CA (US);
Toshiaki Adachi, San Jose, CA (US);
Ankan Pramanick, San Jose, CA (US);
Mark Elston, Salinas, CA (US);
Ramachandran Krishnaswamy, Cupertino, CA (US);
Toshiaki Adachi, San Jose, CA (US);
Advantest America R&D Center, Inc., Santa Clara, CA (US);
Abstract
A method for developing a test program for a semiconductor test system is disclosed. The method includes describing a test plan file in a test program language (TPL), where the test plan file describes at least one test of the test program, describing a test class file in a system program language (SPL) and a corresponding pre-header file of the test class file in the TPL, where the test class file describes an implementation of the at least one test of the test program, and generating the test program using the test plan file, the test class file, and the pre-header file.