The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2007

Filed:

Aug. 13, 2004
Applicants:

Toshiaki Adachi, San Jose, CA (US);

Ankan Pramanick, San Jose, CA (US);

Mark Elston, Salinas, CA (US);

Inventors:

Toshiaki Adachi, San Jose, CA (US);

Ankan Pramanick, San Jose, CA (US);

Mark Elston, Salinas, CA (US);

Assignee:

Advantest America R&D Center, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for integrating test modules in a modular test system includes creating component categories for integrating vendor-supplied test modules and creating a calibration and diagnostics (C&D) framework for establishing a standard interface between the vendor-supplied test modules and the modular test system, where the C&D framework comprises interface classes communicating vendor-supplied module integration information. The method further includes receiving a vendor-supplied test module, retrieving module integration information from the vendor-supplied test module in accordance with the component categories, and integrating the vendor-supplied test module into the modular test system based on the module integration information using the C&D framework.


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