The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Dec. 19, 2003
Benoit Nadeau-dostie, Gatineau, CA;
Benoit Nadeau-Dostie, Gatineau, CA;
LogicVision, Inc., San Jose, CA (US);
Abstract
An improvement in a scan testing method for testing a circuit having memory elements arranged into one or more scan chains, the scan testing method having a shift phase for serially loading test patterns into the scan chains and serially unloading test response patterns from the scan chains and a capture phase for capturing the response of the circuit to the test pattern, includes, during the capture phase, connecting the serial output of each scan chain to its serial input and applying a predetermined number of capture clock cycles with the memory elements configured in a non-capture mode for all but the last capture clock cycle and configured in capture mode for the last capture clock cycle.