The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2007

Filed:

Sep. 02, 2004
Applicants:

Claus Neubauer, Monmouth Junction, NJ (US);

Zehra Cataltepe, Fair Haven, NJ (US);

Chao Yuan, Plainsboro, NJ (US);

Jie Cheng, Cranbury, NJ (US);

Ming Fang, Princeton Junction, NJ (US);

Wesley Mccorkle, Oviedo, FL (US);

Inventors:

Claus Neubauer, Monmouth Junction, NJ (US);

Zehra Cataltepe, Fair Haven, NJ (US);

Chao Yuan, Plainsboro, NJ (US);

Jie Cheng, Cranbury, NJ (US);

Ming Fang, Princeton Junction, NJ (US);

Wesley McCorkle, Oviedo, FL (US);

Assignees:

Siemens Power Generation, Inc., Orlando, FL (US);

Siemens Corporate Research, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tool for sensor management and fault visualization in machine condition monitoring. The method and system are able to monitor a plurality of sensors at one time. The sensors may be used in a power plant system monitoring system. The method and system may display a fault status for each sensor in the plurality of sensors in a single display, wherein the fault status for each sensor is displayed over time. The method and system also provide a mechanism that permits a user to examine details of each sensor in the plurality of sensors at any given time. In addition, the method and system are capable of categorizing each fault in the fault status using one or more properties or categorizing criteria. The method and system also permit sensors to be tested such that different operating models may be examined by utilizing different sensors.


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