The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2007

Filed:

Nov. 12, 2003
Applicants:

Sharon Duvdevani, Mazkeret Batya, IL;

Tally Gilat-bernshtein, Yavne, IL;

Eyal Klingbell, Rehovot, IL;

Meir Mayo, Rehovot, IL;

Shmuel Rippa, Ramat Gan, IL;

Zeev Smilansky, Meishar, IL;

Inventors:

Sharon Duvdevani, Mazkeret Batya, IL;

Tally Gilat-Bernshtein, Yavne, IL;

Eyal Klingbell, Rehovot, IL;

Meir Mayo, Rehovot, IL;

Shmuel Rippa, Ramat Gan, IL;

Zeev Smilansky, Meishar, IL;

Assignee:

Orbotech Ltd., Yavane, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06K 9/36 (2006.01); G06K 9/48 (2006.01); H04N 7/18 (2006.01); H04N 9/47 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for inspecting electrical circuits, and a system for carrying out the method, generating a representation of boundaries of elements in an image of an electrical circuit which is under inspection, and analyzing at least some locations of at least some boundaries in the representation of boundaries of elements to identify defects in the electrical circuit.


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