Nonvolatile semiconductor memory device

Abstract

A non-volatile semiconductor memory device provides for higher integration by reducing the area of occupation of direct peripheral circuits, in which the memory cell of an AND type flash memory includes a selection gate, a float gate, a control gate that functions as a word line, and an n-type semiconductor region (source, drain) that functions as a local bit line. A pair of local bit lines adjacent to each other in a memory mat are connected with one global bit line at one end in the direction of the column of the memory mat, and a selection MOS transistor, formed by one enhancement type MOS transistor and one depletion type MOS transistor; is connected in series with each of the pair of local bit lines. One of the local bit lines is selected by turning the selection MOS transistor on/off.