The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Nov. 10, 2003
Applicants:
Helmut Fischer, Sindelfingen, DE;
Bernhard Scherzinger, Esslingen, DE;
Inventors:
Helmut Fischer, Sindelfingen, DE;
Bernhard Scherzinger, Esslingen, DE;
Assignee:
Immobiliengesellschaft Helmut Fischer GmbH & Co. KG, Sindelfingen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for non-destructive measurement of the thickness of thin layers, has a housing and a probe which is connected to an evaluation unit and to which signals are emitted during a measurement for determining the layer thickness, and having a display apparatus which indicates at least the measurement data from the evaluation unit. At least one further display apparatus is positioned on the housing away from the plane of the first display apparatus.