The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Nov. 20, 2002
Applicants:
John P. Nolan, Santa Fe, NM (US);
Feng Zhou, Los Alamos, NM (US);
Inventors:
John P. Nolan, Santa Fe, NM (US);
Feng Zhou, Los Alamos, NM (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides methods and kits for detecting chromosome translocations. The present invention further provides methods for diagnosing cancer.
Nolan, John. (2007). Early leukemia diagnostics using microsphere arrays (U.S. Patent No. 7179598). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7179598
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile