The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2007
Filed:
Sep. 10, 2000
Nissim Savareigo, Ashdod, IL;
Dan Shalom, Rishon Lezion, IL;
Nur Arad, Tel Aviv, IL;
Orbotech Ltd., , IL;
Abstract
A method for automatically optically inspecting an electrical circuit (), comprising: acquiring at least one optical image of an electrical circuit (); generating at least one first inspection image from the at least one image and determining regions of candidate defects () therefrom; generating at least one additional inspection image for regions surrounding candidate defects (), said at least one additional inspection image at least partially including optical information not included in the at least one first inspection image; and determining whether the candidate defect () is a specious defect by inspecting the at least one additional inspection image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile