The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2007
Filed:
Apr. 14, 2005
Noriaki Sakamoto, Kodaira, JP;
Takehisa Yokohama, Higashiyamato, JP;
Tomoru Sato, Fuchu, JP;
Takafumi Kikuchi, Higashiyamato, JP;
Fujio Ito, Hanno, JP;
Noriaki Sakamoto, Kodaira, JP;
Takehisa Yokohama, Higashiyamato, JP;
Tomoru Sato, Fuchu, JP;
Takafumi Kikuchi, Higashiyamato, JP;
Fujio Ito, Hanno, JP;
Renesas Technology Corp., Tokyo, JP;
Abstract
To provide a test technology capable of reducing a package size by reducing a number of terminals (pins) in a semiconductor integrated circuit of SIP or the like constituted by mounting a plurality of semiconductor chips to a single package, in SIPconstituted by mounting a plurality of semiconductor chips to a signal package of ASICSDRAMand the like, a circuit of testing SDRAM(SDRAMBIST) is provided at inside of ASICand SDRAMis tested from outside of SDRAMthat is, from ASICBy providing the test circuit of SDRAMat inside of ASICit is not necessary to extrude a terminal for testing SDRAMto outside of SIP