The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Jun. 12, 2003
Stephen J. Hlotyak, Belmont, MA (US);
Alan L. Blitz, Newton, MA (US);
Randall B. Stimson, Boston, MA (US);
Stephen J. Hlotyak, Belmont, MA (US);
Alan L. Blitz, Newton, MA (US);
Randall B. Stimson, Boston, MA (US);
Teradyne, Inc., North Reading, MA (US);
Abstract
An automatic test system, such as might be used to test semiconductor devices as part of their manufacture. The test system uses instruments to generate and measure test signals. The automatic test system has a hardware and software architecture that allows instruments to be added to the test system after it is manufactured. The software is segregated into instrument specific and instrument independent software. Predefined interfaces to the software components allow for easy integration of instruments into the test system and also easy reuse of the software as the physical implementation of the test system or the instruments changes from tester to tester in a product family.