The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Oct. 17, 2003
Peter Jomo Walla, Cologne, DE;
Andre Koltermann, Cologne, DE;
Ulrich Kettling, Cologne, DE;
Mathias Scharte, Cologne, DE;
Peter Jomo Walla, Cologne, DE;
Andre Koltermann, Cologne, DE;
Ulrich Kettling, Cologne, DE;
Mathias Scharte, Cologne, DE;
Direvo Biotech AG, Nattermannallee, DE;
Abstract
A method for analyzing properties of a sample by measuring fluorescence parameters in multiple foci, comprises the steps of splitting a collimated primary laser beam with a splitting device into at least two collimated secondary laser beams and deflecting the secondary laser beams such that they propagate at different propagation angles with respect to an optical axis of a focussing optic, focussing the secondary laser beams with the focussing optic into at least two volume elements in the sample, detecting light emitted from the volume elements with a detecting device, and evaluating the detected light for obtaining the properties to be analyzed. Furthermore, a device for implementing this method is described. The invention is particularly suited for high-throughput screening applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile