The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Oct. 07, 2005
Masao Takahashi, Takatsuki, JP;
Yoshirou Nakata, Souraku-gun, JP;
Tadaaki Mimura, Katano, JP;
Toshihiko Sakashita, Neyagawa, JP;
Toshiyuki Fukuda, Nagaokakyo, JP;
Masao Takahashi, Takatsuki, JP;
Yoshirou Nakata, Souraku-gun, JP;
Tadaaki Mimura, Katano, JP;
Toshihiko Sakashita, Neyagawa, JP;
Toshiyuki Fukuda, Nagaokakyo, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
Circuits under electrode terminals and a nonconductor layer of the electrode terminals in semiconductor devices are prevented from being damaged during a test, such as a burn-in test, on the semiconductor devices formed on a wafer. Alignment patterns provided on the semiconductor wafer have detector electrode terminals and conductor electrode terminals. A detector electrode terminal surrounds a conductor electrode terminal separated by a gap from the detector electrode terminals and a portion of the surrounding detector electrode terminal is open.