The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2007

Filed:

Jun. 21, 2004
Applicants:

Mee-suk Jung, Suwon-si, KR;

Myung-bok Lee, Suwon-si, KR;

Eun-hyoung Cho, Seoul, KR;

Hae-sung Kim, Yongin-si, KR;

Jin-seung Sohn, Seoul, KR;

Inventors:

Mee-suk Jung, Suwon-si, KR;

Myung-bok Lee, Suwon-si, KR;

Eun-hyoung Cho, Seoul, KR;

Hae-sung Kim, Yongin-si, KR;

Jin-seung Sohn, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 3/00 (2006.01); G02B 9/00 (2006.01); G02B 13/18 (2006.01); G02B 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an objective optical system employing a gradient index (GRIN) lens. A refractive index of the GRIN lens is changed in an axial direction and a direction perpendicular to the axial direction. The GRIN lens has a refractive index n satisfying the following equation: where z is a distance from the center of the lens in the axial direction and r is a distance from the center of the lens in the direction perpendicular to the axial direction. Thus, an objective optical system with a high numerical aperture can correct aberration.


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