The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Oct. 02, 2003
Yasuyuki Nozuyama, Tokyo, JP;
Yasuyuki Nozuyama, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
An apparatus for selecting test patterns in accordance with an embodiment of the present invention has a first test pattern selecting module configured to define selected test patterns and unselected test patterns, a fault simulation module configured to simulate whether test patterns detect faults, a weighting module configured to add a weight to each of the first undetected faults, a fault sampling module configured to extract second undetected faults from the first undetected faults to which the added weights are given, and a second test pattern selecting module configured to extract additionally selected test patterns based on the added weight.