The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2007

Filed:

Nov. 12, 2004
Applicants:

Geoffrey Herrick, Portland, OR (US);

James E. Spinar, Clackamas, OR (US);

Daniel R. Murphy, Beaverton, OR (US);

William R. Pooley, Aloha, OR (US);

Inventors:

Geoffrey Herrick, Portland, OR (US);

James E. Spinar, Clackamas, OR (US);

Daniel R. Murphy, Beaverton, OR (US);

William R. Pooley, Aloha, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention is a method and apparatus for a probe tip contact for electrically coupling a substrate to a probe tip. The apparatus, in one embodiment, comprises a wrap-around contact that is precision formed utilizing a hydroform tool and brazed to a surface of a substrate. In another embodiment, the apparatus comprises a contact flange, a mounting flange extending from a first edge of the contact flange in an orientation substantially perpendicular to the contact flange, and a substantially circular indentation formed in the contact flange adapted for accommodating movement of said probe tip relative to said substrate.


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