The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Jul. 08, 2005
Will A. Miller, Camas, WA (US);
Wesley G. Stanley, Milwaukie, OR (US);
David R. Trine, Portland, OR (US);
Will A. Miller, Camas, WA (US);
Wesley G. Stanley, Milwaukie, OR (US);
David R. Trine, Portland, OR (US);
Credence Systems Corporation, Milpitas, CA (US);
Abstract
A test head for a semiconductor integrated circuit tester includes a main support structure defining a device interface board location, and a contact support frame that is displaceable relative to the main support structure for engaging a device interface board at the device interface board location. The contact support frame is composed of a first frame member having a first surface region that is directed towards the device interface board location and also having an opposite second surface region, a second frame member having a first surface region in spaced confronting relationship with the second surface region of the first frame member and also having an opposite second surface region, and a resilient mechanism effective between the first and second frame members for permitting the first frame member to move relative to the second frame member when force is applied to the second frame member at the second surface region thereof for displacing the contact support frame towards the device interface board location.