The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2007
Filed:
Jan. 30, 2004
Sadami Takeoka, Osaka, JP;
Seiji Kajihara, Fukuoka, JP;
Sadami Takeoka, Osaka, JP;
Seiji Kajihara, Fukuoka, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
All untestable delay faults are hardly calculated. Thus, when the fault coverage of an test sequence for a delay fault is calculated, the fault coverage is not calculated without excluding the number of untestable faults. Accordingly the fault coverage does not correctly represent a test quality. The delay faults are partly selected to analyze how many untestable delay faults exist among the selected delay faults. Thus, the, number of untestable delay faults included all the delay faults are estimated. Thus, a method for evaluating a delay fault test quality for calculating the fault coverage that correctly represents the test quality by using this value is provided.