The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Sep. 30, 2004
Hsu Ming Cheng, Hsin-Chu, TW;
Hsu Ming Cheng, Hsin-Chu, TW;
Abstract
An effective and easy to fabricate method to test multiple integrated circuit device designs using a single, probe card design is provided. A universal, probe card design is disclosed herein to test a plurality of integrated circuit devices at the wafer level. Integrated circuit probe pads and probe card probe I/O pins are designed in grid-like pattern on a region of the substrate. Ground terminal encircles the region of the I/O pins and power terminals are provided on the substrate. The I/O terminals can have a constant pitch array or a varying pitch array. The probe card can be used for a family of integrated circuit devices. A method to test flip chip, integrated circuits using a universal probe card has also been disclosed to reduce probe card proliferation and fabrication cost.