The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2006

Filed:

Jul. 30, 2004
Applicants:

Michinori Nishikawa, Ibaraki, JP;

Takashi Okada, Ibaraki, JP;

Kinji Yamada, Ibaraki, JP;

Inventors:

Michinori Nishikawa, Ibaraki, JP;

Takashi Okada, Ibaraki, JP;

Kinji Yamada, Ibaraki, JP;

Assignee:

JSR Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

A chemical mechanical polishing stopper film comprising at least one organic polymer, said film having a dielectric constant of 4 or lower, and a chemical mechanical polishing method. The chemical mechanical polishing method comprises forming a chemical mechanical polishing stopper film comprising at least one organic polymer on an insulating film so that the stopper film is interposed between the insulating film and a metal film to be removed by chemical mechanical polishing, and then removing the metal film with a chemical mechanical polishing slurry.


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Nishikawa, Michinori. (2006). Chemical mechanical polishing stopper film, process for producing the same, and method of chemical mechanical polishing (U.S. Patent No. 7153767). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7153767

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