The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2006
Filed:
Mar. 02, 2005
Tal Raichman, San Francisco, CA (US);
Peter P. Cuevas, Los Gatos, CA (US);
James Borthwick, Sunnyvale, CA (US);
Michael A. Casolo, Oakland, CA (US);
Tal Raichman, San Francisco, CA (US);
Peter P. Cuevas, Los Gatos, CA (US);
James Borthwick, Sunnyvale, CA (US);
Michael A. Casolo, Oakland, CA (US);
Qualitau, Inc., Santa Clara, CA (US);
Abstract
A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit decouples the stress and monitor portions of the unit so that the requirements of each can be optimized. Deglitching and current clamp switches can be incorporated in the dual channel source measurement unit to prevent glitches in the switching circuitry and to limit or clamp current flow to or from the monitor and stress sources.