The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2006
Filed:
Mar. 08, 2005
Shin Saitoh, Tokyo, JP;
Yoshiyuki Nakayama, White Plains, NY (US);
Daisuke Kamuki, Saitama, JP;
Kayoko Yamaya, Tokyo, JP;
Shin Saitoh, Tokyo, JP;
Yoshiyuki Nakayama, White Plains, NY (US);
Daisuke Kamuki, Saitama, JP;
Kayoko Yamaya, Tokyo, JP;
Jeol Ltd., Tokyo, JP;
Abstract
A method of detecting nozzle clogging by the use of threshold values that can be set easily is accomplished. Also, an analytical instrument equipped with a nozzle clogging detector using threshold values that can be set easily is accomplished. Threshold values corresponding to aspiration volumes of sample are calculated from plural threshold values (P, P, and P) that have been set for discrete aspiration volumes (SV, SV, and SV), respectively. The threshold values are found for each of plural aspiration programs corresponding to plural sets of conditions under which a sample is diluted, and for each of plural aspiration programs corresponding to plural kinds of samples. Threshold values are found for each of plural detection sensitivities.