The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2006

Filed:

Mar. 05, 2004
Applicant:

Eiji Nagata, Kanagawa, JP;

Inventor:

Eiji Nagata, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to avoid generation of a routing complexity of LSI and a signal rounding due to insertion of the isolation testing circuit, if a plurality of IPs are incorporated into LSI, the present invention provides an isolation testing circuits having test switching selectorstofor selecting any one of a test input signal (or a test input transit signal) and a normal input signal, and test signal transit bufferstofor relaying the test input signal (or the test input transit signal) are formed in respective IP blockstoincorporated into an LSI. Adjacent isolation testing circuits are connected mutually based on a floor plan or layout placement information such that a wiring length of a test input signaland test input transit signalsto, which are connected in a single stroke of a pen, can be reduced shortest.


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