The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2006
Filed:
Aug. 05, 2004
Takeyoshi Taguchi, Tachikawa, JP;
Takeo Tajima, Akiruno, JP;
Takeyoshi Taguchi, Tachikawa, JP;
Takeo Tajima, Akiruno, JP;
Rigaku Corporation, Akishima, JP;
Abstract
An X-ray analysis apparatus is disclosed, in which X-rays emitted from an X-ray source are applied to a sample and a two-dimensional CCD sensor detects the X-rays diffracted by the sample. The X-ray analysis apparatus has a 2θ-rotation drive and a program. The 2θ-rotation drive moves the two-dimensional CCD sensor. The program is executed to control the motion of the CCD sensor. The 2θ-rotation drive rotates the CCD sensor around ω-axis that extends over the surface of the sample. The program synchronizes the transfer of charges in the CCD sensor with the motion of the CCD sensor driven by the 2θ-rotation drive. Hence, data items for the same diffraction angle can be accumulated in the pixels of the two-dimensional CCD sensor. This achieves high-speed and high-sensitivity in detection of diffracted X-rays.