The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Nov. 04, 2004
Applicants:
John T. Bratt, Fort Collins, CO (US);
Jeffrey R. Rearick, Fort Collins, CO (US);
Inventors:
John T. Bratt, Fort Collins, CO (US);
Jeffrey R. Rearick, Fort Collins, CO (US);
Assignee:
Avago Technologies General IP (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scan test architecture is implemented. The scan test architecture provides a method of performing scan test of unbalanced scan chains. The scan test architecture generates a control signal (i.e., masking signal) to mask bits in an unbalanced scan chain. In one embodiment, the control signal is generated with a logic gate, a comparator, and a counter.