The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Jul. 02, 2002
Douglas W. Smith, Los Altos, CA (US);
Thornton W. Sargent, Iv, Sutter Creek, CA (US);
Stuart F. Daniels, Moorestown, NJ (US);
Douglas W. Smith, Los Altos, CA (US);
Thornton W. Sargent, IV, Sutter Creek, CA (US);
Stuart F. Daniels, Moorestown, NJ (US);
inTEST Corporation, Wilmington, DE (US);
Abstract
An apparatus and method for coupling a test head and probe card in an IC testing system incorporating patterned divider elements () disposed between rows of signal conductors () to provide matching characteristic impedance values along each row of signal conductors. The divider elements have a patterned conductive layer formed thereon that is electrically connected to ground, and a method for determining a useful pattern is provided. Test dividers () fabricated with openings of various size and shape are used to construct transmission lines. The impedance of these lines is measured, and the results are used to interpolate an appropriate opening size and shape to achieve a desired transmission line impedance.