The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2006

Filed:

Jun. 30, 2004
Applicants:

Zhiyi Yu, Gilbert, AZ (US);

Jay A. Curless, Phoenix, AZ (US);

Yong Liang, Gilbert, AZ (US);

Alexandra Navrotsky, Davis, CA (US);

Sergey Ushakov, Davis, CA (US);

Bich-yen Nguyen, Austin, TX (US);

Alexander Demkov, Austin, TX (US);

Inventors:

Zhiyi Yu, Gilbert, AZ (US);

Jay A. Curless, Phoenix, AZ (US);

Yong Liang, Gilbert, AZ (US);

Alexandra Navrotsky, Davis, CA (US);

Sergey Ushakov, Davis, CA (US);

Bich-Yen Nguyen, Austin, TX (US);

Alexander Demkov, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/94 (2006.01); H01L 21/469 (2006.01);
U.S. Cl.
CPC ...
Abstract

Semiconductor structures and processes for fabricating semiconductor structures comprising hafnium oxide layers modified with lanthanum oxide or a lanthanide-series metal oxide are provided. A semiconductor structure in accordance with an embodiment of the invention comprises an amorphous layer of hafnium oxide overlying a substrate. A lanthanum-containing dopant or a lanthanide-series metal-containing dopant is comprised within the amorphous layer of hafnium oxide. The process comprises growing an amorphous layer of hafnium oxide overlying a substrate. The amorphous layer of hafnium oxide is doped with a dopant having the chemical formulation LnO, where Ln is lanthanum, a lanthanide-series metal, or a combination thereof, and X is any number greater than zero. The doping step may be performed during or after growth of the amorphous layer of hafnium oxide.


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