The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Sep. 04, 2003
Applicants:
Swee M. Mok, Schaumburg, IL (US);
Chi-haur Wu, Skokie, IL (US);
Inventors:
Swee M. Mok, Schaumburg, IL (US);
Chi-Haur Wu, Skokie, IL (US);
Assignees:
Motorola, Inc., Schaumburg, IL (US);
Northwestern University, Evanston, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A structured product coding system that reflects both the components as are used to fabricate a given product but component manipulators as are used to execute part-mating operations to combine the components and intermediate structures as are assembled during the fabrication process can be used to generate a generic assembly/disassembly tree that corresponds to that product.
Mok, Swee. (2006). Manufacturing and de-fabrication analysis method and apparatus (U.S. Patent No. 7136713). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7136713
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile